Development of a sequence-characterized amplified region marker for diagnosis of dwarf bunt of wheat and detection of Tilletia controversa Kuhn
文献类型: 外文期刊
作者: Gao, L.;Liu, T. G.;Chen, W. Q.
作者机构:
关键词: amplified fragment length polymorphism;dwarf bunt of wheat;PCR;sequence-characterized amplified region;Tilletia controversa Kuhn
期刊名称: LETTERS IN APPLIED MICROBIOLOGY
ISSN: 0266-8254
年卷期: 2009 年 49 卷 2 期
页码:
收录情况: SCI
摘要: Aims: Dwarf bunt of wheat, caused by Tilletia controversa Kuhn, is a destructive disease on wheat as well as an important international quarantined disease in many countries. The objective of this investigation was to develop a diagnostic molecular marker generated from amplified fragment length polymorphism (AFLP) for rapid identification of T. controversa. Methods and Results: A total of 30 primer combinations were tested by AFLP to detect DNA polymorphisms between T. controversa and related species. The primer combination E08/M02 generated a polymorphic pattern displaying a 451-bp DNA fragment specific for T. controversa. The marker was converted into a sequence-characterized amplified region (SCAR), and specific primers (SC-01(49)/SC-02(415)), designed for use in PCR detection assays, amplified a unique DNA fragment in all isolates of T. controversa, but not in the related pathogens. The detection limit with the primer set SC-01(49)/SC-02(415) was 10 ng of DNA which could be obtained from 11 mu g of teliospores in a 25-mu l PCR reaction. Conclusions: An approach to distinguish T. controversa from similar pathogenic fungi has been developed based on the use of a SCAR marker. Significance and Impact of the Study: Development of the simple, high throughput assay kit for the rapid diagnosis of dwarf bunt of wheat and detection of T. controversa is anticipated in further studies.
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