Quantitative trait loci for temperature-sensitive resistance to Puccinia striiformis f. sp tritici in wheat cultivar Flinor
文献类型： 外文期刊
作者： Zhang, Z. Y.;Lin, R. M.;Xu, S. C.;Zuo, L. L.;Cao, Y. Y.
作者机构：
关键词： Simple sequence repeats (SSR);Temperature-sensitive resistance;Wheat yellow rust
期刊名称： EUPHYTICA
ISSN： 0014-2336
年卷期： 2011 年 178 卷 3 期
页码：
收录情况： SCI
摘要： Stripe (yellow) rust, caused by Puccinia striiformis Westend. f. sp. tritici Eriks. (Pst), is an important disease of wheat (Triticum aestivum L.) globally. Use of host resistance is an important strategy to manage the disease. The cultivar Flinor has temperature-sensitive resistance to stripe rust. To map quantitative trait loci (QTLs) for these temperature-sensitive resistances, Flinor was crossed with susceptible cultivar Ming Xian 169. The seedlings of the parents, and F(1), F(3) progeny were screened against Chinese yellow rust race CYR32 in controlled-temperature growth chambers under different temperature regimes. Genetic analysis confirmed two genes for temperature-sensitive stripe rust resistance. A linkage map of SSR markers was constructed using 130 F(3) families derived from the cross. Two temperature-sensitive resistance QTLs were detected on chromosome 5B, designated QYr-tem-5B.1 and QYr-tem-5B.2, respectively, and are separated by a genetic distance of over 50 cM. The loci contributed 33.12 and 37.33% of the total phenotypic variation for infection type, respectively, and up to 70.45% collectively. Favorable alleles of these two QTLs came from Flinor. These two QTLs are temperature-sensitive resistance loci and different from previously reported QTLs for resistance to stripe rust.
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