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期刊名称

euphytica(1)

关键词

simple sequence repeats (ssr)(1)
temperature-sensitive resistance(1)
wheat yellow rust(1)

作者

Zhang, Z. Y. AND Lin, R. M. AND Xu, S. C. AND Zuo, L. L. AND Cao, Y. Y.(0)

机构

chinese acad agr sci, inst plant protect, state key lab biol plant dis & insect pests, beijing 100193, peoples r china(1)
shenyang agr univ, dept plant protect, shenyang, peoples r china(1)

年份

2011(1)

科研产出

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资源类型: 外文期刊

作者:Zhang, Z. Y.(精确检索)

作者:Lin, R. M.(精确检索)

作者:Xu, S. C.(精确检索)

作者:Zuo, L. L.(精确检索)

作者:Cao, Y. Y.(精确检索)

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1Quantitative trait loci for temperature-sensitive resistance to Puccinia striiformis f. sp tritici in wheat cultivar Flinor

作者： Zhang, Z. Y.; Lin, R. M.; Xu, S. C.; Zuo, L. L.; Cao, Y. Y.; SCI

机构： Chinese Acad Agr Sci, Inst Plant Protect, State Key Lab Biol Plant Dis & Insect Pests, Beijing 100193, Peoples R China; Shenyang Agr Univ, Dept Plant Protect, Shenyang, Peoples R China;

来源：EUPHYTICA

关键词： Simple sequence repeats (SSR) Temperature-sensitive resistance Wheat yellow rust